Granted Patent
Utility
US 5,285,153 · App. 07/947,729
Apparatus for facilitating scan testing of asynchronous logic circuitry
Inventors:
Bahram Ahanin, Craig Lytle, Ricky W. Ho
Patented Case
View Patent ↗
Granted: Feb 8, 1994
Filed: Sep 21, 1992
Inventors
Bahram Ahanin
Craig Lytle
Ricky W. Ho
Assignee (at issue)
Altera Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.