Granted Patent
Utility
US 5,293,386 · App. 07/974,855
Integrated semiconductor memory with parallel test capability and redundancy method
Inventors:
Peter Muhmenthaler, Hans-Dieter Oberle, Martin Peisl, Dominique Savignac
Patented Case
View Patent ↗
Granted: Mar 8, 1994
Filed: Nov 10, 1992
Inventors
Peter Muhmenthaler
Hans-Dieter Oberle
Martin Peisl
Dominique Savignac
Assignee (at issue)
Siemens Aktiengesellschaft
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.