Granted Patent
Utility
US 5,299,252 · App. 08/044,363
Fluorescent X-ray film thickness measuring apparatus
Inventor:
Masanori Takahashi
Patented Case
View Patent ↗
Granted: Mar 29, 1994
Filed: Apr 7, 1993
Inventor
Masanori Takahashi
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.