IP Library Granted Patent US 5,327,437
Granted Patent Utility
US 5,327,437 · App. 07/797,616

Method for testing electronic assemblies in the presence of noise

Inventor: Raymond J. Balzer
Patented Case View Patent ↗
Granted: Jul 5, 1994 Filed: Nov 25, 1991
Inventor
Raymond J. Balzer
Assignee (at issue)
Hewlett-Packard Company, L.P.

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Quick Facts
Patent No.
US 5,327,437
App. No.
07/797,616
Filed
1991-11-25
Granted
1994-07-05
Kind
A