IP Library › Granted Patent US 5,329,228
Granted Patent Utility
US 5,329,228 · App. 07/910,029

Test chip for semiconductor fault analysis

Inventor: Alain Comeau
Patented Case View Patent ↗
Granted: Jul 12, 1994 Filed: Jul 23, 1992
Inventor
Alain Comeau
Assignee (at issue)
Mitel Corporation

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Quick Facts
Patent No.
US 5,329,228
App. No.
07/910,029
Filed
1992-07-23
Granted
1994-07-12
Kind
A