IP Library Granted Patent US 5,331,571
Granted Patent Utility
US 5,331,571 · App. 07/919,417

Testing and emulation of integrated circuits

Inventors: Alan Paul Aronoff, Marc Birnkrant, Osamu Matsushima, Kyosuke Sugishita, Hisaharu Oba, Katta N. Reddy, Richard Ian Olsen, Brent N. Dichter
Patented Case View Patent ↗
Granted: Jul 19, 1994 Filed: Jul 22, 1992
Inventors
Alan Paul Aronoff
Marc Birnkrant
Osamu Matsushima
Kyosuke Sugishita
Hisaharu Oba
Katta N. Reddy
Richard Ian Olsen
Brent N. Dichter
Assignee (at issue)
NEC Electronics Corporation

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Quick Facts
Patent No.
US 5,331,571
App. No.
07/919,417
Filed
1992-07-22
Granted
1994-07-19
Kind
A