Granted Patent
Utility
US 5,341,685 · App. 08/042,632
Method and apparatus for non-destructive testing of inner lead tab bonds and semiconductor chips
Inventor:
Steven J. Malone
Patented Case
View Patent ↗
Granted: Aug 30, 1994
Filed: Apr 5, 1993
Inventor
Steven J. Malone
Assignee (at issue)
LOCKHEED MARTIN CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.