Granted Patent
Utility
US 5,349,587 · App. 07/858,377
Multiple clock rate test apparatus for testing digital systems
Inventors:
Benoit Nadeau-Dostie, Abu Hassan, Dwayne Burek, Stephen K. Sunter
Patented Case
View Patent ↗
Granted: Sep 20, 1994
Filed: Mar 26, 1992
Inventors
Benoit Nadeau-Dostie
Abu Hassan
Dwayne Burek
Stephen K. Sunter
Assignee (at issue)
Nortel Networks Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.