Granted Patent
Utility
US 5,364,187 · App. 08/028,040
System for repeatable temperature measurement using surface reflectivity
Inventors:
Randhir P. S. Thakur, Gurtej S. Sandhu, Annette L. Martin
Patented Case
View Patent ↗
Granted: Nov 15, 1994
Filed: Mar 8, 1993
Inventors
Randhir P. S. Thakur
Gurtej S. Sandhu
Annette L. Martin
Assignee (at issue)
Micron Semiconductor, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.