Granted Patent
Utility
US 5,366,906 · App. 07/962,000
Wafer level integration and testing
Inventors:
Robert J. Wojnarowski, Constantine A. Neugebauer, Wolfgang Daum, Bernard Gorowitz, Eric J. Wildi, Michael Gdula, Stanton Earl Weaver, Anthony A. Immorlica
Patented Case
View Patent ↗
Granted: Nov 22, 1994
Filed: Oct 16, 1992
Inventors
Robert J. Wojnarowski
Constantine A. Neugebauer
Wolfgang Daum
Bernard Gorowitz
Eric J. Wildi
Michael Gdula
Stanton Earl Weaver
Anthony A. Immorlica
Assignee (at issue)
LOCKHEED MARTIN CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.