Granted Patent
Utility
US 5,376,791 · App. 08/021,481
Secondary ion mass spectometry system
Inventors:
Lynwood W. Swanson, John M. Lindquist, Milton C. Jaehnig, Joseph Puretz
Patented Case
View Patent ↗
Granted: Dec 27, 1994
Filed: Feb 22, 1993
Inventors
Lynwood W. Swanson
John M. Lindquist
Milton C. Jaehnig
Joseph Puretz
Assignee (at issue)
FEI Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.