Granted Patent
Utility
US 5,376,883 · App. 07/984,921
Analysis of integrated circuit operability using a focused ion beam
Inventor:
Takashi Kaito
Patented Case
View Patent ↗
Granted: Dec 27, 1994
Filed: Dec 4, 1992
Inventor
Takashi Kaito
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.