Granted Patent
Utility
US 5,379,110 · App. 07/965,856
Method and apparatus for measuring surface characteristics of material
Inventors:
Toshiaki Matsui, Kenichi Araki
Patented Case
View Patent ↗
Granted: Jan 3, 1995
Filed: Oct 23, 1992
Inventors
Toshiaki Matsui
Kenichi Araki
Assignee (at issue)
Communications Research Laboratory, Ministry of Posts and Telecommunications
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.