Granted Patent
Utility
US 5,381,344 · App. 07/863,257
Apparatus and method for obtaining a list of numbers of wafers for integrated circuit testing
Inventors:
John G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Mercedes P. Gil, Robert W. Proulx
Patented Case
View Patent ↗
Granted: Jan 10, 1995
Filed: Apr 6, 1992
Inventors
John G. Rohrbaugh
Thomas H. Baker
Michael J. Bennett
Mercedes P. Gil
Robert W. Proulx
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.