Granted Patent
Utility
US 5,394,348 · App. 07/885,151
Control system for semiconductor circuit testing system
Inventor:
Nobuaki Abe
Patented Case
View Patent ↗
Granted: Feb 28, 1995
Filed: May 18, 1992
Inventor
Nobuaki Abe
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.