Granted Patent
Utility
US 5,400,342 · App. 07/837,667
Semiconductor memory having test circuit and test method thereof
Inventors:
Tsuneo Matsumura, Tsuneo Mano, Junzo Yamada, Junichi Inoue
Patented Case
View Patent ↗
Granted: Mar 21, 1995
Filed: Feb 14, 1992
Inventors
Tsuneo Matsumura
Tsuneo Mano
Junzo Yamada
Junichi Inoue
Assignee (at issue)
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.