Granted Patent
Utility
US 5,404,359 · App. 07/906,196
Fail safe, fault tolerant circuit for manufacturing test logic on application specific integrated circuits
Inventors:
Russell L. Gillenwater, Davoud Safari, Gary D. Owens
Patented Case
View Patent ↗
Granted: Apr 4, 1995
Filed: Jun 29, 1992
Inventors
Russell L. Gillenwater
Davoud Safari
Gary D. Owens
Assignee (at issue)
Tandem Computers Incorporated
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.