Granted Patent
Utility
US 5,440,121 · App. 08/174,292
Scanning probe microscope
Inventors:
Masatoshi Yasutake, Nobutaka Nakamura
Patented Case
View Patent ↗
Granted: Aug 8, 1995
Filed: Dec 28, 1993
Inventors
Masatoshi Yasutake
Nobutaka Nakamura
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.