Granted Patent
Utility
US 5,450,016 · App. 08/266,574
Method of quickly evaluating contact resistance of semiconductor device
Inventor:
Katsuhiro Masumori
Patented Case
View Patent ↗
Granted: Sep 12, 1995
Filed: Jun 28, 1994
Inventor
Katsuhiro Masumori
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.