Granted Patent
Utility
US 5,450,414 · App. 08/063,191
Partial-scan built-in self-testing circuit having improved testability
Inventor:
Chih-Jen Lin
Patented Case
View Patent ↗
Granted: Sep 12, 1995
Filed: May 17, 1993
Inventor
Chih-Jen Lin
Assignee (at issue)
AT&T CORP.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.