IP Library › Granted Patent US 5,451,489
Granted Patent Utility
US 5,451,489 · App. 08/055,439

Making and testing an integrated circuit using high density probe points

Inventor: Glenn J. Leedy
Patented Case View Patent ↗
Granted: Sep 19, 1995 Filed: Apr 30, 1993
Inventor
Glenn J. Leedy

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Quick Facts
Patent No.
US 5,451,489
App. No.
08/055,439
Filed
1993-04-30
Granted
1995-09-19
Kind
A