Granted Patent
Utility
US 5,455,420 · App. 08/273,740
Scanning probe microscope apparatus for use in a scanning electron
Inventors:
Huddee Ho, Paul E. West
Patented Case
View Patent ↗
Granted: Oct 3, 1995
Filed: Jul 12, 1994
Inventors
Huddee Ho
Paul E. West
Assignee (at issue)
Topometrix Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.