Granted Patent
Utility
US 5,459,736 · App. 08/065,177
Scan path circuit for testing multi-phase clocks from sequential circuits
Inventor:
Yoshiyuki Nakamura
Patented Case
View Patent ↗
Granted: Oct 17, 1995
Filed: May 20, 1993
Inventor
Yoshiyuki Nakamura
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.