Granted Patent
Utility
US 5,477,493 · App. 08/317,606
Semiconductor device having a boundary scan test circuit
Inventor:
Hirokazu Danbayashi
Patented Case
View Patent ↗
Granted: Dec 19, 1995
Filed: Sep 29, 1994
Inventor
Hirokazu Danbayashi
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.