Granted Patent
Utility
US 5,481,186 · App. 08/317,070
Method and apparatus for integrated testing of a system containing digital and radio frequency circuits
Inventors:
Michael S. Heutmaker, Madhuri Jarwala, Duy Le
Patented Case
View Patent ↗
Granted: Jan 2, 1996
Filed: Oct 3, 1994
Inventors
Michael S. Heutmaker
Madhuri Jarwala
Duy Le
Assignee (at issue)
AT&T CORP.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.