Granted Patent
Utility
US 5,486,772 · App. 08/268,755
Reliability test method for semiconductor trench devices
Inventors:
Fwu-Iuan Hshieh, Calvin Choi, William H. Cook, Lih-Ying Ching, Mike F. Chang
Patented Case
View Patent ↗
Granted: Jan 23, 1996
Filed: Jun 30, 1994
Inventors
Fwu-Iuan Hshieh
Calvin Choi
William H. Cook
Lih-Ying Ching
Mike F. Chang
Assignee (at issue)
SILICONIX INCORPORATED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.