Granted Patent
Utility
US 5,489,851 · App. 08/349,709
Identification of pin-open faults by measuring current or voltage change resulting from temperature change
Inventors:
John M. Heumann, Ronald J. Peiffer
Patented Case
View Patent ↗
Granted: Feb 6, 1996
Filed: Dec 5, 1994
Inventors
John M. Heumann
Ronald J. Peiffer
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.