Granted Patent
Utility
US 5,506,400 · App. 08/220,103
Scanning type probe microscope
Inventors:
Akihiko Honma, Kazutoshi Watanabe
Patented Case
View Patent ↗
Granted: Apr 9, 1996
Filed: Mar 30, 1994
Inventors
Akihiko Honma
Kazutoshi Watanabe
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.