Granted Patent
Utility
US 5,528,162 · App. 08/309,473
Semiconductor device having a test mode setting circuit
Inventor:
Toshiya Sato
Patented Case
View Patent ↗
Granted: Jun 18, 1996
Filed: Sep 22, 1994
Inventor
Toshiya Sato
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.