Granted Patent
Utility
US 5,537,355 · App. 08/346,740
Scheme to test/repair multiple large RAM blocks
Inventors:
Pradip Banerjee, Atul V. Ghia, Patrick Chuang
Patented Case
View Patent ↗
Granted: Jul 16, 1996
Filed: Nov 30, 1994
Inventors
Pradip Banerjee
Atul V. Ghia
Patrick Chuang
Assignees (at issue)
SONY CORPORATION OF JAPAN
SONY ELECTRONICS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.