Granted Patent
Utility
US 5,550,374 · App. 08/241,972
Methods and apparatus for determining interstitial oxygen content of relatively large diameter silicon crystals by infrared spectroscopy
Inventors:
Joseph C. Holzer, Harold W. Korb, Klaus Drescher
Patented Case
View Patent ↗
Granted: Aug 27, 1996
Filed: May 12, 1994
Inventors
Joseph C. Holzer
Harold W. Korb
Klaus Drescher
Assignee (at issue)
MEMC Electronic Materials, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.