Granted Patent
Utility
US 5,569,947 · App. 08/496,064
Insulated-gate field-effect transistor in a semiconductor device in which source/drain electrodes are defined by formation of silicide on a gate electrode and a field-effect transistor
Inventors:
Shoichi Iwasa, Takeshi Naganuma
Patented Case
View Patent ↗
Granted: Oct 29, 1996
Filed: Jun 28, 1995
Inventors
Shoichi Iwasa
Takeshi Naganuma
Assignee (at issue)
NIPPON STEEL CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.