Granted Patent
Utility
US 5,574,499 · App. 08/239,023
Integrated circuit for testing a plurality of 1H memories
Inventor:
Miyuki Nasu
Patented Case
View Patent ↗
Granted: Nov 12, 1996
Filed: May 6, 1994
Inventor
Miyuki Nasu
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.