Granted Patent
Utility
US 5,583,446 · App. 08/351,396
Electro-optically controlled measurement probe system
Inventors:
Koichiro Takeuchi, Yukio Kasahara, Akira Miura, Hideto Iwaoka, Tadashi Sugiyama
Patented Case
View Patent ↗
Granted: Dec 10, 1996
Filed: Feb 14, 1995
Inventors
Koichiro Takeuchi
Yukio Kasahara
Akira Miura
Hideto Iwaoka
Tadashi Sugiyama
Assignee (at issue)
Teratech Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.