Granted Patent
Utility
US 5,587,793 · App. 08/470,157
Birefringence distribution measuring method
Inventors:
Sadao Nakai, Yasukazu Izawa, Masanobu Yamanaka, Masato Ohmi, Masanori Akatsuka, Chiyoe Yamanaka, Yoshiyuki Yonezawa
Patented Case
View Patent ↗
Granted: Dec 24, 1996
Filed: Jun 6, 1995
Inventors
Sadao Nakai
Yasukazu Izawa
Masanobu Yamanaka
Masato Ohmi
Masanori Akatsuka
Chiyoe Yamanaka
Yoshiyuki Yonezawa
Assignees (at issue)
Sadao Nakai
INSTITUTE FOR LASER TECHNOLOGY
FUJI ELECTRIC CO., LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.