Granted Patent
Utility
US 5,596,440 · App. 08/511,741
Method and apparatus for analyzing the characteristics of an optical circuit
Inventors:
Dietmar Patz, Emmerich Mueller, Christian Hentschel
Patented Case
View Patent ↗
Granted: Jan 21, 1997
Filed: Aug 7, 1995
Inventors
Dietmar Patz
Emmerich Mueller
Christian Hentschel
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.