Granted Patent
Utility
US 5,604,447 · App. 08/580,365
Prescaler IC testing method and test probe card
Inventor:
Isamu Takano
Patented Case
View Patent ↗
Granted: Feb 18, 1997
Filed: Dec 28, 1995
Inventor
Isamu Takano
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.