Granted Patent
Utility
US 5,604,751 · App. 08/555,438
Time linearity measurement using a frequency locked, dual sequencer automatic test system
Inventor:
Michael C. Panis
Patented Case
View Patent ↗
Granted: Feb 18, 1997
Filed: Nov 9, 1995
Inventor
Michael C. Panis
Assignee (at issue)
Teradyne, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.