Granted Patent
Utility
US 5,606,567 · App. 08/327,338
Delay testing of high-performance digital components by a slow-speed tester
Inventors:
Vishwani D. Agrawal, Tapan Jyoti Chakraborty
Patented Case
View Patent ↗
Granted: Feb 25, 1997
Filed: Oct 21, 1994
Inventors
Vishwani D. Agrawal
Tapan Jyoti Chakraborty
Assignee (at issue)
LUCENT TECHNOLOGIES INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.