Granted Patent
Utility
US 5,606,568 · App. 08/565,337
Method and apparatus for performing serial and parallel scan testing on an integrated circuit
Inventor:
Bruce D. Sudweeks
Patented Case
View Patent ↗
Granted: Feb 25, 1997
Filed: Nov 30, 1995
Inventor
Bruce D. Sudweeks
Assignee (at issue)
Megatest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.