Granted Patent
Utility
US 5,608,337 · App. 08/481,744
Method and apparatus of testing an integrated circuit device
Inventors:
Matthew C. Hendricks, Ernest Allen, III
Patented Case
View Patent ↗
Granted: Mar 4, 1997
Filed: Jun 7, 1995
Inventors
Matthew C. Hendricks
Ernest Allen, III
Assignee (at issue)
Altera Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.