Granted Patent
Utility
US 5,612,643 · App. 08/618,730
Semiconductor integrated circuit which prevents malfunctions caused by noise
Inventor:
Takeshi Hirayama
Patented Case
View Patent ↗
Granted: Mar 18, 1997
Filed: Mar 20, 1996
Inventor
Takeshi Hirayama
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.