Granted Patent
Utility
US 5,629,944 · App. 08/670,823
Test mode setting circuit of test circuit for semiconductor memory
Inventor:
Akihiko Kagami
Patented Case
View Patent ↗
Granted: May 13, 1997
Filed: Jun 25, 1996
Inventor
Akihiko Kagami
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.