Granted Patent
Utility
US 5,644,249 · App. 08/659,861
Method and circuit testing apparatus for equalizing a contact force between probes and pads
Inventor:
January Kister
Patented Case
View Patent ↗
Granted: Jul 1, 1997
Filed: Jun 7, 1996
Inventor
January Kister
Assignee (at issue)
Probe Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.