IP Library › Granted Patent US 5,644,393
Granted Patent Utility
US 5,644,393 · App. 08/678,069

Extraneous substance inspection method and apparatus

Inventors: Hisato Nakamura, Tetsuya Watanabe, Yoshio Morishige
Patented Case View Patent ↗
Granted: Jul 1, 1997 Filed: Jul 10, 1996
Inventors
Hisato Nakamura
Tetsuya Watanabe
Yoshio Morishige
Assignee (at issue)
Hitachi Electronics Engineering Co., Ltd.

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 5,644,393
App. No.
08/678,069
Filed
1996-07-10
Granted
1997-07-01
Kind
A