Granted Patent
Utility
US 5,646,813 · App. 08/398,244
Method and apparatus for reducing ESD during thermal shock testing
Inventors:
Min-Chung Jon, Douglas C. Smith, Joseph Charles Veshinfsky
Patented Case
View Patent ↗
Granted: Jul 8, 1997
Filed: Mar 3, 1995
Inventors
Min-Chung Jon
Douglas C. Smith
Joseph Charles Veshinfsky
Assignee (at issue)
LUCENT TECHNOLOGIES INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.