Granted Patent
Utility
US 5,656,942 · App. 08/505,419
Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane
Inventors:
Michael Watts, Lawrence Hendler
Patented Case
View Patent ↗
Granted: Aug 12, 1997
Filed: Jul 21, 1995
Inventors
Michael Watts
Lawrence Hendler
Assignee (at issue)
Electroglas, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.