Granted Patent
Utility
US 5,657,240 · App. 08/431,599
Testing and removal of redundancies in VLSI circuits with non-boolean primitives
Inventors:
Srimat Chakradhar, Steven G. Rothweiler, Vishwani D. Agrawal
Patented Case
View Patent ↗
Granted: Aug 12, 1997
Filed: May 1, 1995
Inventors
Srimat Chakradhar
Steven G. Rothweiler
Vishwani D. Agrawal
Assignee (at issue)
NEC USA, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.