Granted Patent
Utility
US 5,668,487 · App. 08/358,105
Circuit detecting electric potential of semiconductor substrate by compensating fluctuation in threshold voltage of transistor
Inventor:
Toru Chonan
Patented Case
View Patent ↗
Granted: Sep 16, 1997
Filed: Dec 16, 1994
Inventor
Toru Chonan
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.