IP Library › Granted Patent US 5,675,539
Granted Patent Utility
US 5,675,539 · App. 08/575,953

Method and circuit for testing memories in integrated circuit form

Inventors: Jean-Michel Mirabel, Emilio Yero
Patented Case View Patent ↗
Granted: Oct 7, 1997 Filed: Dec 21, 1995
Inventors
Jean-Michel Mirabel
Emilio Yero
Assignee (at issue)
SGS-Thomson Microelectronics S.A.

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Quick Facts
Patent No.
US 5,675,539
App. No.
08/575,953
Filed
1995-12-21
Granted
1997-10-07
Kind
A